Електронний каталог Науково-технічної бібліотеки Національного університету „Львівська політехніка“

Image Processing for the Detection of Features and Defects: algorithms and Applications [Текст] : monograph / Roman Melnyk

Автор: Melnyk Roman (1946-)Вихідні дані: Chisinau : LAP LAMBERT Academic Publishing, 2023Опис: 309 сторінок : ілюстрації ; 22 смМова: англійська.Країна: Молдова.Форматний номер: 2 формат (висота > 17-23 см)ISBN: 978-620-6-14459-5.Вид літератури за цільовим призначенням: НауковіВид/характер текстових документів: наукові виданняУДК: 004.93Примітки щодо походження:
Дар Жежнича П. І.
[Інв. № IST16170]
Наявність бібліографії/покажчика: Бібліографія: сторінки 300-302 (47 назв).Найменування теми як предметна рубрика: Редагування зображень Анотація:
    Any brand names and product names mentioned in this book are subject to trademark, brand or patent protection and are trademarks or registered trademarks of tneir respective holders. The use of brand names, product names, common names, trade names, product descriptions etc. even without a particular marking in this work is in no way to be construed to mean that such names may be regarded as unrestricted in respect of trademark and brand protection legislation and could thus be used by anyone.
Зміст:
Preface.....IV
Chapter 1. Custering algorithms for image processing.....1
1.1. Algorithms and criteria.....1
1.2. Clustering К-means algorithm.....10
1.3. Reducing hierarchical clustering algorithm complexity.....12
1.4. Space decomposition by multilevel segmentation.....17
1.5. З-stages clustering algorithm of hypercubes.....28
1.6. З-stages clustering algorithm for image analysis and classification.....31
1.6.1. Pattern decomposition.....35
1.6.2. Decomposition algorithm.....36
1.6.3. 4-D integral pattern features.....40
1.6.4. Application of structure features for image analysis.....43
1.7. Conclusion.....39
Chapter 2. Piecewise linear approximation.....41
2.1. Introduction to piecewise linear approximation.....41
2.2. Algorithm oi Ramer-Dougias-Packer for piecewise linear approximation.....44
2.3. Modified algorithm of Ramer-Douglas-Packer for piecewise linear approximation.....46
2.4. Method of average coefficients.....48
2.5. Chebyshev approximation method.....51
2.6. Image compression by piecewise linear approximation.....53
2.7. Investigation of piecewise-linear approximation algorithms to compress images.....56
2.8. Image compression by the Visvalingam-Whyatt algorithm.....62
2.9. Conclusion.....66
Chapter 3. Segmentation and transformation of images.....68
3.1. Segmentation by statistical features.....68
3.2. Segmentation by inclined plane.....73
3.3. Multilevel segmentation using approximation of cumulative histogram.....80
3.4. Distributed cumulative histogram.....85
3.5. Segmentation by K-means clustering.....87
3.6. Transformation of image by rotation.....95
3.7. Conclusion......104
Chapter 4. Skeletonization and clustering for defects detection in pcb images.....105
4.1. Hilditch's thinning algorithm and its application.....105
4.2. Auxiliary algorithms for PCB images enhancement.....114
4.2.1. Flood fill algorithm.....117
4.2.2. Multilevel segmentation of PCB images.....119
4.2.3. PCB images enhancement by К-mean clustering.....122
4.3. PCB model for start points detection.....123
4.3.1. PCB image model.....127
4.3.2. PCB image contacts detection.....129
4.3.3. Assigning PCB contacts to chains.....136
4.4. Short and open PCB defects detection.....136
4.5. Defects detection in traces.....139
4.6. Defects detection by subtraction and clustering.....142
4.7. Shift, connectivity and trace defects detection by comparison of mask images.....150
4.8. Conclusion.....157
Chapter 5. Extraction and analysis efface features.....158
5.1. Parametric statistical features for one level partitioning.....158
5.2. Face images multilevel segmentation and classification by clustering algorithm.....168
5.3. Face Images and its fragments classification by clustering.....173
5.4. Features effaces by distributed cumulative histogram.....178
5.5. Face profile features extraction.....185
5.6. Conclusions.....195
Chapter 6. Detection of defects in material surfaces.....196
6.1. Partitioning algorithms for defects detection.....196
6.2. Defect intensity measurement by distributed cumulative histogram and clustering.....203
6.3. Defects measurement by intensity fragments clustering.....211
6.3.1. Image transformation and relative intensity clustering.....215
6.3.2. Defects measurement by clustering of distributed cumulative histogram.....216
6.4. Image approximation for defects detection.....222
6.5 Defects detection m textured images.....229
6.5. Defects detection by clustering and rotating image.....239
6.6. Conclusion.....246
Chapter 7. Cloudiness analysis by statistical features and clustering.....248
7.1. Two simple methods for cloudiness analysis.....248
7.2. Deleting influence of neighboring territories.....252
7.3. Classification of clouds by statistical characteristics of images.....259
7.4. Analysis of cloudiness by color concentration features.....261
7.5. Centers of mathematical expectation of pixel coordinates.....268
7.6. Classification of cloudiness by features clustering.....274
7.7. Three-stages clustering algorithm for clouds analysis.....280
7.8. Analysis of moving cloud direction and velocity.....287
7.9. Conclusion.....299
References.....300
Supplement.....304
Тип одиниці: Книга
Фонди
Тип одиниці зберігання Поточна бібліотека Шифр зберігання Стан Очікується на дату Штрих-код
 Книга Книга Книгосховище відділу книгозберігання (KSHVKZ) Фонд відділу книгозберігання IST16170 (Огляд полиці(Відкривається нижче)) Доступно IST16170

IST16170 Дар Жежнича П. І.

Бібліографія: сторінки 300-302 (47 назв)

Preface.....IV
Chapter 1. Custering algorithms for image processing.....1
1.1. Algorithms and criteria.....1
1.2. Clustering К-means algorithm.....10
1.3. Reducing hierarchical clustering algorithm complexity.....12
1.4. Space decomposition by multilevel segmentation.....17
1.5. З-stages clustering algorithm of hypercubes.....28
1.6. З-stages clustering algorithm for image analysis and classification.....31
1.6.1. Pattern decomposition.....35
1.6.2. Decomposition algorithm.....36
1.6.3. 4-D integral pattern features.....40
1.6.4. Application of structure features for image analysis.....43
1.7. Conclusion.....39
Chapter 2. Piecewise linear approximation.....41
2.1. Introduction to piecewise linear approximation.....41
2.2. Algorithm oi Ramer-Dougias-Packer for piecewise linear approximation.....44
2.3. Modified algorithm of Ramer-Douglas-Packer for piecewise linear approximation.....46
2.4. Method of average coefficients.....48
2.5. Chebyshev approximation method.....51
2.6. Image compression by piecewise linear approximation.....53
2.7. Investigation of piecewise-linear approximation algorithms to compress images.....56
2.8. Image compression by the Visvalingam-Whyatt algorithm.....62
2.9. Conclusion.....66
Chapter 3. Segmentation and transformation of images.....68
3.1. Segmentation by statistical features.....68
3.2. Segmentation by inclined plane.....73
3.3. Multilevel segmentation using approximation of cumulative histogram.....80
3.4. Distributed cumulative histogram.....85
3.5. Segmentation by K-means clustering.....87
3.6. Transformation of image by rotation.....95
3.7. Conclusion......104
Chapter 4. Skeletonization and clustering for defects detection in pcb images.....105
4.1. Hilditch's thinning algorithm and its application.....105
4.2. Auxiliary algorithms for PCB images enhancement.....114
4.2.1. Flood fill algorithm.....117
4.2.2. Multilevel segmentation of PCB images.....119
4.2.3. PCB images enhancement by К-mean clustering.....122
4.3. PCB model for start points detection.....123
4.3.1. PCB image model.....127
4.3.2. PCB image contacts detection.....129
4.3.3. Assigning PCB contacts to chains.....136
4.4. Short and open PCB defects detection.....136
4.5. Defects detection in traces.....139
4.6. Defects detection by subtraction and clustering.....142
4.7. Shift, connectivity and trace defects detection by comparison of mask images.....150
4.8. Conclusion.....157
Chapter 5. Extraction and analysis efface features.....158
5.1. Parametric statistical features for one level partitioning.....158
5.2. Face images multilevel segmentation and classification by clustering algorithm.....168
5.3. Face Images and its fragments classification by clustering.....173
5.4. Features effaces by distributed cumulative histogram.....178
5.5. Face profile features extraction.....185
5.6. Conclusions.....195
Chapter 6. Detection of defects in material surfaces.....196
6.1. Partitioning algorithms for defects detection.....196
6.2. Defect intensity measurement by distributed cumulative histogram and clustering.....203
6.3. Defects measurement by intensity fragments clustering.....211
6.3.1. Image transformation and relative intensity clustering.....215
6.3.2. Defects measurement by clustering of distributed cumulative histogram.....216
6.4. Image approximation for defects detection.....222
6.5 Defects detection m textured images.....229
6.5. Defects detection by clustering and rotating image.....239
6.6. Conclusion.....246
Chapter 7. Cloudiness analysis by statistical features and clustering.....248
7.1. Two simple methods for cloudiness analysis.....248
7.2. Deleting influence of neighboring territories.....252
7.3. Classification of clouds by statistical characteristics of images.....259
7.4. Analysis of cloudiness by color concentration features.....261
7.5. Centers of mathematical expectation of pixel coordinates.....268
7.6. Classification of cloudiness by features clustering.....274
7.7. Three-stages clustering algorithm for clouds analysis.....280
7.8. Analysis of moving cloud direction and velocity.....287
7.9. Conclusion.....299
References.....300
Supplement.....304

Any brand names and product names mentioned in this book are subject to trademark, brand or patent protection and are trademarks or registered trademarks of tneir respective holders. The use of brand names, product names, common names, trade names, product descriptions etc. even without a particular marking in this work is in no way to be construed to mean that such names may be regarded as unrestricted in respect of trademark and brand protection legislation and could thus be used by anyone.

Натисніть на зображення, щоб переглянути його в оглядачі зображень

Локальне зображення обкладинки
Поділитися

Національний університет „Львівська політехніка“

Науково-технічна бібліотека

Koha Ukraine